Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques
Fuente: Waste Management
Publication date: 15 December 2024Source: Waste Management, Volume 190Author(s): Shaun T. Lancaster, Eskil Sahlin, Marcus Oelze, Markus Ostermann, Jochen Vogl, Valérie Laperche, Solène Touze, Jean-Philippe Ghestem, Claire Dalencourt, Régine Gendre, Jessica Stammeier, Ole Klein, Daniel Pröfrock, Gala Košarac, Aida Jotanovic, Luigi Bergamaschi, Marco Di Luzio, Giancarlo D’Agostino, Radojko Jaćimović, Melissa Eberhard