Fecha de publicación: 07/07/2021 Fuente: Wipo "Sensorization" An electromagnetic sensor 2 for use in apparatus for measuring material properties comprises a plate substrate 4, a plurality of first sensor elements 8 on the substrate forming a first array 10, a plurality of second sensor elements 38 on the substrate forming a second array 40, wherein the two arrays are regular arrays (rows 12a, 12b) (rows 42a, 42b) and are mutually aligned, a plurality of electrical connectors and electrical terminals on the substrate, wherein the first sensor elements each comprise a first type of sensor selected from an inductive sensor, a capacitive sensor and a magnetic sensor, and the second sensor elements each comprise a second type of sensor selected from an inductive sensor, a capacitive sensor and a magnetic sensor, wherein the first and second types of sensor are different. In a further embodiment the sensor elements may be co-located to overlap on the substrate surface.